Analysis and reduction of phase errors caused by nonuniform surface reflectivity in a phase-shifting measurement system
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| 第一作者： |
Chen SL(陈松林);Xia RB(夏仁波);Zhao JB(赵吉宾);Zhang HY(张洪瑶);Hu MB(胡茂邦) |
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| 发表年度： |
2017 |
| 期： |
3 |
| 卷： |
56 |
| 页： |
1-9 |
| 摘要： |
The measurement accuracy of a phase-shifting measurement system is adversely affected by phase errors. This paper presents a theoretical analysis of phase errors caused by nonuniform surface reflectivity, such as varying reflectivity and a sharp change in reflectivity. Based on the analysis, a method to adaptively adjust the maximum input gray level of each pixel in projected fringe patterns to the local reflectivity was proposed to reduce phase errors. Experimental results for a planar checkerboard show that the measurement error can be reduced by 56.6% by using the proposed method. |
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| 刊物名称： |
Optical Engineering |
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